Scanning Impedance Microscopy: From Impedance Spectra to Impedance Images

Scanning Impedance Microscopy: From Impedance Spectra to Impedance Images

Impedance spectroscopy has long been recognized as one of the major techniques for the characterization of ac transport in materials. The primary limitation of this technique is the lack of spatial resolution that precludes the equivalent circuit elements from being unambiguously associated with individual microstructural features. Here we present a scanning probe microscopy technique for quant...

Scanning impedance microscopy (SIM): A novel approach for AC transport imaging

Scanning Impedance Microscopy (SIM) is one of the novel scanning probe microscopy (SPM) techniques, which has been developed to taking image from sample surface, providing quantitative information with high lateral resolution on the interface capacitance, and investigating the local capacitance–voltage (C–V) behavior of the interface and AC transport properties. The SIM is an ordinary AFM equip...

Scanning impedance microscopy (SIM): A novel approach for AC transport imaging

Scanning Impedance Microscopy (SIM) is one of the novel scanning probe microscopy (SPM) techniques, which has been developed to taking image from sample surface, providing quantitative information with high lateral resolution on the interface capacitance, and investigating the local capacitance–voltage (C–V) behavior of the interface and AC transport properties. The SIM is an ordinary AFM equip...

Local impedance measurement of an electrode/single-pentacene-grain interface by frequency-modulation scanning impedance microscopy

Right Copyright (year) AIP Publishing. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in (J. Appl. Phys. 118, 055501 (2015); http://dx.doi.org/10.1063/1.4927921) and may be found at http://scitation.aip.org/content/aip/journal/jap/118/5/10.1063/1. 4927921; The full-text file will be m...

Optical impedance matching with scanning near-field optical microscopy (SNOM)